MIL-L-48063A(MI)
3.4.8 Ground Circuit. The intervalometer shall provide a grounding
circuit to insure safety during loading and operation. The ground circuit
shall ground all output pins when the intervalometer is in the load or
arm position. As the intervalometer is advancing through its sequence,
the ground circuit shall individually ground each output except those
being energized. The ground circuit shall ground the output with a
resistance of not more than 0.1 ohm. Grounding shall be verified by
the presence of no more than 5 millivolts on any grounded output during
the application of power.
3.4.9 Sequencing. The intervalometer shall sequence through the
output stations as called out on applicable drawings. The output stations
may or may not be loaded. The intervalometer shall continue through the
sequence pattern even if power is removed and then re-applied. The time
between application of power and output pulse shall not exceed 30 milliseconds.
3.4.10 Life. The intervalometer shall meet all requirements of 3.4
through 3.4.9 after a minimum of 400 cycles in single mode and 400 cycles
in ripple mode.
3.4.11 Environmental. The intervalometer shall meet all of the
requirements of 3.4 through 3.4.9 before or after, as required, exposure
to the following environrnental conditions:
3.4.11.1 Humidity.
In accordance with MIL-STD-81O, Method 507,
Procedure I.
3.4.11.2 Sand and dust.
In accordance with MIL-STD-81O, Method
510.
3.4.11.3 Shock test. In accordance with MIL-STD-81O, Method 516,
Procedure IV, Figure 51 6-2, Amplitude A, Duration C.
3.4.11.4 Acceleration test.
In accordance with MIL-STD-81O, Method
513, Procedure II, Table 513-11.
3.4.11.5 High temperature. In accordance with MIL-STD-81O, Method
501, Procedure I for 8 hours min.
3.4.11.6 Low temperature. In accordance with MIL-STD-81O, Method 502,
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Procedure I for 8 hours min., at minus (-) 54 degrees ( ) C (-65°F).
3.4.11.7 Salt fog test.
In accordance with MIL-STD-810, Method 509.
3.4.11.8 Vibration test. In accordance with MIL-STD-81O, Method 514,
Procedure I, Curve J, and Procedure II, Part 3, Curve AF.
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