MIL-P-82534(OS)
4.6.1.4.5, only at ambient temperature, not less than twice in each axis. The
readback time tolerance of each individual reading shall be plus or minus 0.05
second for channel one and plus or minus 0.80 second for channel two.
4,5.1.6 Temperature, o p e r a t i n g condition.
4.5.1.6.1 Low extreme. The programmer shall be subjected to a tem-
perature of plus 35 plus 5 minus 0 degrees F for not less than 4 hours, and while
at that temperature, the programmer shall pass the operation tests of 4.6.1.4.
4.5.1.6.2 High extreme. The programmer shall be subjected to a tern-
perature of 120 plus 0 minus 5 degrees F for not less than 4 hours and while at
that temperature shall pass the operation tests of 4.6.1.4.
4.5.1.7 Acceleration. The programmer, mounted as shown in Figure 2,
shall be subjected to acceleration of 25 plus 2.5 minus 0g in the direction shown
in Figure 1 for not less than 4 seconds. Thereafter, the programmer shall pass
the quality conformance inspection of 4.6.1.1, 4.6.1.3.1, and 4.6.1.5.
4 . 5 . 1 . 8 Operating life. The programmer shall be energized as described
in 4. 6.1.4 for a period of 500 hours at room ambient temperature. The opera-
tion of the programmer shall be tested as specified in 4.6.1.4.1 through
4.6. 1.4.8 at least once during every 50-hour period; these tests shall be per-
formed at room ambient temperature only. At the end of the 500-hour period
the programmer shall pass the quality conformance inspection.
4.5.1.9 F u n g u s . Unless otherwise specified in the contract or order, this
test shall be performed on preproduction sample units only. The programmer
shall be subjected to Fungus Resistance Tests, Procedure I, as specified in
MIL-E-5272 .
4.5.1010 Salt spray. The programmer shall be subjected to Salt Spray
Tests, Procedure I, as specified in MIL-E-5272 for 50 hours. Connector 1A1J2
shall be sealed against moisture during this test.
4.6 Quality conformance inspection. Each programmer shall be subjected
to the tests and examinations as described in 4.6.1.
4.6.1 Test procedure. The programmer shall be subjected to the tests
and examinations as outlined herein. Unless otherwise specified, inability of
the programmer to pass the tests and examinations shall constitute a failure.
4.6.1.1 Circuit resistance. Using the two resistance measuring devices
specified in 4.4.la and b, measure the resistance of the programmer circuits
listed in Table I. The resistance shall be an indicated therein.
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